Deep Learning-Based Autonomous Scanning Electron Microscope
Jonggyu Jang,Hyeonsu Lyu,Hyun Jong Yang,Moohyun Oh,Junhee Lee,Jonggyu Jang,Hyeonsu Lyu,Hyun Jong Yang,Moohyun Oh,Junhee Lee
By virtue of their ultra high resolution, scanning electron microscopes (SEMs) are essential to study topography, morphology, composition, and crystallography of materials, and thus are widely used for advanced researches in physics, chemistry, pharmacy, geology, etc. The major hindrance of using SEMs is that obtaining high quality images from SEMs requires a professional control of many control p...
