Smart-Inspect: Micro Scale Localization and Classification of Smartphone Glass Defects for Industrial Automation
M Usman Maqbool Bhutta,Shoaib Aslam,Peng Yun,Jianhao Jiao,Ming Liu,M Usman Maqbool Bhutta,Shoaib Aslam,Peng Yun,Jianhao Jiao,Ming Liu
The presence of any type of defect on the glass screen of smart devices has a great impact on their quality. We present a robust semi-supervised learning framework for intelligent micro-scaled localization and classification of defects on a 16K pixel image of smartphone glass. Our model features the efficient recognition and labeling of three types of defects: scratches, light leakage due to crack...
